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Ministry of Finance, R.O.C.
Laws and Regulations Retrieving System

Print Time:115.10.27 03:28

Content

Title: Wafer and Integrated Circuit (IC) Testing Is Not Within the Scope of Inspection and Testing under the Regulations Governing the Establishment and Management of Bonded Warehouses Ch
Date: 2003.06.13
Legislative: Announced by the Ministry of Finance Tai-Tsai-Kuan-Tzu No. 0920550401 on June 13, 2003
Content:

Wafer and integrated circuit (IC) testing services have become a specialized industry and are part of the semiconductor manufacturing process. They are not within the scope of inspection and testing under Subparagraph 1, Paragraph 1, Article 36 of the Regulations Governing the Establishment and Management of Bonded Warehouses (Editor’s note: Article 34 of the current Regulations).

Data Source:Ministry of Finance, R.O.C. Laws and Regulations Retrieving System